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紅外線光譜儀(PE-FTIR)

Fourier Transform Infrared Spectroscopy

熱機械分析儀(TMA)

Thermal Mechanical Analyzer

雙面光罩對準曝光儀(Aligner)

Double Side Mask Aligner

S3000N高解晰可變真空掃描式電子顯微鏡及能量散佈光譜儀 (VVSEM)

Variable Vacuum Scanning Electron Microscope and Energy Dispersive Spectrometer

調幅式示差掃描分析儀(TA-MDSC)

Modulated Differential Scanning Calorimetry

感應耦合電漿光譜儀 (ICP-OES)

Inductively Coupled Plasma Optima Optical Emission Spectrometer

高解析多功能掃描式探針顯微鏡 (SPM/AFM)

Ｍultimode Scanning Probe Microscope

高解析比表面積分析儀 (ASAP/BET)

High Resolution Surface Area and Porosimetry Analyser

熱重分析儀(TA-TGA)

Thermogravimetric Analysis

示差掃描量熱-熱重分析聯用(TA-SDT)

Simultaneous DSC-TGA

熱阻式蒸鍍系統 (TE)

Thermal Evaporation Coater

冷場發射掃描式電子顯微鏡及能量散佈光譜儀 (FE-SEM)

Cold Field Emission Scanning Electron Microscope and Energy Dispersive Spectrometer

微波消化系統 (MW)

Microwave Lab Station

S3000H掃描式電子顯微鏡及能量散佈光譜儀 (SEM)

Scanning Electron Microscope and Energy Dispersive Spectrometer

倒立螢光顯微鏡(NIFM)

Inverted Fluorescence Microscopy

桌上型X光繞射儀(D2-XRD)

X-ray Diffraction

雷射粒徑分析儀 (SPSA)

Laser Diffraction Submicron Particle Size Analyzer

S3400N掃描式電子顯微鏡及能量散佈光譜儀

Scanning Electron Microscope and Energy Dispersive Spectrometer

全反射X射線螢光光譜儀(XRF)

Total Reflection X-Ray Fluorescence Spectrometer

多功能微區X光薄膜繞射儀(D8-XRD)

Multipurpose X-Ray Thin-Film Micro Area Diffractometer

申請委測預約

自行操作預約

教育訓練

教育訓練公告

2018-12-28 108.1月份第一階段教育訓練開放持有有效執照之D8-XRD使用者,請...

2018-07-05 理論課程補考時間及地點